Performance of HgCdTe, InGaAs and quantum well GaAs/AlGaAs staring infrared focal plane arrays

被引:23
作者
Kozlowski, LJ
Vural, K
Arias, JM
Tennant, WE
DeWames, RE
机构
来源
MATERIAL SCIENCE AND MATERIAL PROPERTIES FOR INFRARED OPTOELECTRONICS | 1997年 / 3182卷
关键词
focal plane array; HgCdTe; InGaAs; GaAlAs QWIP; IR sensor; photodetector;
D O I
10.1117/12.280406
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The ability to hybridize various detector arrays in disparate technologies to an assortment of state-of-the-art silicon readouts has enabled direct comparison of key infrared defector technologies including photovoltaic (PV) HgCdTe/Al2O3, PV HgCdTe/CdZnTe, PV InGaAs/InP, and the photoconductive (PC) GaAs/AlGaAs quantum well infrared photodetector (QWIP). The staring focal plane arrays range in size from 64x64 to 1024x1024; we compare these infrared detector technologies versus operating temperature and background flux via hybrid FPA test at operating temperatures from 32.5 K to room temperature and photon backgrounds from mid-10(5) to approximate to 10(17) photons/cm(2)-s. Several state-of-the-art infrared FPAs are included: a 1.7 mu m 128x128 InGaAs hybrid FPA with room temperature D* of 1.5;10(13) cm-Hz(1/2)/W and 195K D* of 1.1x10(15) cm-Hz(1/2)/W; a 3.2 mu m 1024x1024 FPA for surveillance (BLIP D* of 2.3x10(13) cm-Hz(1/2)/W at 115K at similar to 10(11) photons/cm(2)-s background); a 4.6 mu m 256x256 HgCdTe/Al2O3 FPA for imaging with BLIP NE Delta T of 2.8 mK at 95K; and a 9 mu m 128x128 GaAs QWIP FPA with. 32.5 K D* >10(14) cm-Hz(1/2)/W at 32.5K and 8x10(10) cm-Hz(1/2)/W at 62K.
引用
收藏
页码:2 / 13
页数:12
相关论文
empty
未找到相关数据