Fluctuation-Induced Conductivity of Cu0.5Tl0.5Ba2Ca2Cu2M1O10-δ (M = Si, Sn, Ge) Superconductors

被引：5

作者：

Irfan, M. ^{[1
]}

Khan, Sajid ^{[1
]}

Hassan, Najmul ^{[1
]}

Khan, Nawazish Ali ^{[1
]}

机构：

[1] Quaid I Azam Univ, Dept Phys, Mat Sci Lab, Islamabad, Pakistan

来源：

JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM | 2009年 / 22卷 / 08期

关键词：

Cu0.5Tl0.5Ba2Ca2Cu2M1O10-delta; (M; Si; Sn; Ge); superconductors; Excess conductivity; Ge doping; Crossover temperature; EXCESS ELECTRICAL-CONDUCTIVITY; THERMODYNAMIC FLUCTUATIONS; INPLANE PARACONDUCTIVITY; BI; TEMPERATURE; RESISTIVITY;

D O I：

10.1007/s10948-009-0495-4

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Fluctuation-induced conductivity of Cu0.5Tl0.5Ba2Ca2Cu2M1O10-delta (M = Si, Sn, Ge) superconductors has been studied from the resistivity vs. temperature data. The logarithmic plots of excess conductivity (Delta sigma) vs. reduced temperatures [epsilon = ( T - T-c(mf))/T-c(mf)] show two crossover temperatures with three exponents. A distinct crossover from two-dimensional to three-dimensional conductivity in accordance with the 2D, 3D Aslamazov-Larkin equations has been observed in all the samples. Another crossover from 2D to 0D fluctuations has also been witnessed. FIC data analysis has been found to be quite useful in explaining the superconducting properties of the samples. Si and Sn doped samples have shown almost similar characteristics, while in Ge doped sample diverse behavior is observed.

引用

页码：769 / 774

页数：6

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