Minimal Complete Fault Detection Tests for Circuits of Functional Elements in Standard Basis

被引：1

作者：

Popkov, K. A. ^{[1
]}

机构：

[1] RAS, Keldysh Inst Appl Math, Miusskaya Sq 4, Moscow 125047, Russia

来源：

MOSCOW UNIVERSITY MATHEMATICS BULLETIN | 2019年 / 74卷 / 04期

基金：

俄罗斯基础研究基金会;

关键词：

D O I：

10.3103/S0027132219040077

中图分类号：

O1 [数学];

学科分类号：

0701 ; 070101 ;

摘要：

for each Boolean function we calculate the exact value of the minimal possible length of a complete fault detection test for logic networks implementing this function in the basis "conjunction, disjunction, negation" under one-type stuck-at faults at outputs of gates.

引用

页码：171 / 173

页数：3

共 6 条

[1]

[Бородина Ю.В. Воrоdina Yu.V.], 2008, [Вестник Московского университета. Серия 15: Вычислительная математика и кибернетика, Vestnik Moskovskogo universiteta. Seriya 15: Vychislitel'naya matematika i kibernetika], P40

[2]

Red'kin N P, 1988, VESTN MOSK U MAT M+, V2, P17

[3]

Redkin N. P., 1992, Reliability and Diagnostics of Circuits

[4]

Yablonskii S V, 1986, RELIABILITY MONITORI, P7

[5]

Yablonskii S. V., 1986, Introduction to Discrete Mathematics

[6]

Yablonsky S. V, 1988, Matematicheskie voprosy kibernetiki, V1, P5

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