Development of Surface Fluorescence X-Ray Absorption Fine Structure Spectroscopy Using a Laue-Type Monochromator

被引:3
作者
Wakisaka, Yuki [1 ]
Kido, Daiki [1 ]
Uehara, Hiromitsu [1 ]
Yuan, Qiuyi [1 ]
Feiten, Felix E. [1 ]
Mukai, Shingo [1 ]
Takakusagi, Satoru [1 ]
Uemura, Yohei [2 ]
Yokoyama, Toshihiko [2 ]
Wada, Takahiro [3 ]
Uo, Motohiro [3 ]
Sekizawa, Oki [4 ,5 ]
Uruga, Tomoya [4 ,5 ]
Iwasawa, Yasuhiro [4 ]
Asakura, Kiyotaka [1 ]
机构
[1] Hokkaido Univ, Inst Catalysis, Kita Ku, Sapporo, Hokkaido 0010021, Japan
[2] Inst Mol Sci, Myodaiji Cho, Okazaki, Aichi 4448585, Japan
[3] Tokyo Med & Dent Univ, Grad Sch Med & Dent Sci, Bunkyo Ku, Tokyo 1138549, Japan
[4] Univ Electrocommun, Dept Appl Phys & Chem, Chofu, Tokyo 1828585, Japan
[5] Japan Synchrotron Radiat Res JASRI, Sayo, Hyogo 6795148, Japan
关键词
ANISOTROPIC STRUCTURE-ANALYSIS; MODEL FUEL-CELL; IN-SITU; PLATINUM NANOPARTICLES; TIO2(110) SURFACE; ALPHA-AL2O3; 0001; AU CLUSTERS; EXAFS; CATALYSTS; XAFS;
D O I
10.1002/tcr.201800020
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Surface fluorescence X-ray absorption fine structure (XAFS) spectroscopy using a Laue-type monochromator has been developed to acquire structural information about metals with a very low concentrate on a flat highly oriented pyrolytic graphite (HOPG) surface in the presence of electrolytes. Generally, surface fluorescence XAFS spectroscopy is hindered by strong scattering from the bulk, which often chokes the pulse counting detector. In this work, we show that a bent crystal Laue analyzer (BCLA) can efficiently remove the scattered X-rays from the bulk even in the presence of solution. We applied the technique to submonolayer (similar to 10(14) atoms cm(-2)) Pt on HOPG and successfully obtained high signal/noise in situ XAFS data in combination with back-illuminated fluorescence XAFS (BI-FXAFS) spectroscopy. This technique allows in situ XAFS measurements of flat electrode surfaces to be performed in the presence of electrolytes.
引用
收藏
页码:1157 / 1165
页数:9
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