Superconducting layer thickness of relaxation properties of persistent current in high magnetic field in YBCO-coated conductor

被引：1

作者：

Matsutani, F. ^{[1
]}

Himeki, K. ^{[1
]}

Muchi, M. ^{[1
]}

Otabe, E. S. ^{[1
]}

Matsushita, T. ^{[1
]}

Miyata, S. ^{[2
]}

Ibi, A. ^{[2
]}

Yamada, Y. ^{[2
]}

Shiohara, Y. ^{[2
]}

机构：

[1] Kyushu Inst Technol, Dept Comp Sci & Elect, Fukuoka 8208502, Japan

[2] Superconduct Res Lab, Minato Ku, Tokyo 1050004, Japan

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2009年 / 469卷 / 15-20期

关键词：

YBCO; Thickness; Relaxation; U-0(center dot); Flux creep-flow model; DEPENDENCE;

D O I：

10.1016/j.physc.2009.05.238

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

It was previously shown that the apparent pinning potential U-0(center dot) associated with the relaxation of superconducting current at low magnetic fields depended on the thickness of superconducting layer for IBAD/PLD-processed YBCO-coated conductors. It is necessary to clarify the thickness dependence of the relaxation property at high magnetic fields for application of YBCO-coated conductors in a persistent current mode at Such magnetic fields. In this study, the thickness dependence was investigated in the field range of 1-6 T at 20 K for IBAD/PLD-processed YBCO-coated conductors with the superconducting layer thicknesses of 0.25-1.0 mu m. it was found that U-0(center dot) decreases monotonically with decreasing thickness at 6 T. This seems to be attributed to the two-dimensional pinning mechanism because of the longitudinal flux bundle size limited by the film thickness. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：1122 / 1125

页数：4

共 7 条

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