Issues in assembly process of next-generation fine-pitch chip-on-flex packages for LCD applications

被引:20
作者
Jang, Changsoo [1 ]
Han, Seongyoung [1 ]
Ryu, Jaychul [1 ]
Cho, Seungmin [1 ]
Kim, Hangyu [1 ]
机构
[1] Samsung Techwin Corp Ltd, Semicond Mat R&D Ctr, Gyunggi Do 449712, South Korea
来源
IEEE TRANSACTIONS ON ADVANCED PACKAGING | 2007年 / 30卷 / 01期
关键词
assembly; bump joint; fine-pitch chip-on-flex package; nonflow underfill;
D O I
10.1109/TADVP.2006.890202
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Some of the current assembly issues of fine-pitch chip-on-flex (COF) packages for LCD applications are reviewed. Traditional underfill material, anisotropic conductive adhesive (ACA), and nonconductive adhesive (NCA) are considered in conjunction with two applicable bonding methods including thermal and laser bonding. Advantages and disadvantages of each material/process combination are identified. Their applicability is further investigated to identify a process most suitable to the next-generation fine-pitch packages (less than 35 mu m). Numerical results and subsequent testing results indicate that the NCA/laser bonding process is advantageous for preventing both lead crack and excessive misalignment compared to the conventional bonding process.
引用
收藏
页码:2 / 10
页数:9
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