3-omega measurements of vertically oriented carbon nanotubes on silicon

被引:196
作者
Hu, X. Jack
Padilla, Antonio A.
Xu, Jun
Fisher, Timothy S.
Goodson, Kenneth E.
机构
[1] Stanford Univ, Dept Mech Engn, Stanford, CA 94305 USA
[2] Purdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA
[3] Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
来源
JOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME | 2006年 / 128卷 / 11期
关键词
thermal conductivity; contact thermal resistance; carbon nanotube; thermal inteiface material; 3-omega method; thermal management;
D O I
10.1115/1.2352778
中图分类号
O414.1 [热力学];
学科分类号
摘要
An exploratory thermal interface structure, made of vertically oriented carbon nonotubes directly grown on a silicon substrate, has been thermally characterized using a 3-omega method. The effective thermal conductivities of the carbon nanotubes (CNT) sample, including the effects of voids, are found to be 74 W/m K to 83 W/m K in the temperature range of 295 K to 323 K, one order higher than that of the best thermal greases or phase change materials. This result suggests that the vertically), oriented CNTs potentially can be a promising next-generation thermal interface solution. Howevei; fairly large thermal resistances were observed at the interfaces between the CNT samples and the experimental contact. Minimizing these contact resistances is critical for the application of these materials.
引用
收藏
页码:1109 / 1113
页数:5
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