Evolution of structure and magnetic properties of sputter-deposited CoPt thin films on MgO(111) substrates: Formation of the L11 phase

被引：71
|
作者：
Sun, An-Cheng [1 ,2 ]
Yuan, Fu-Te [3 ]
Hsu, Jen-Hwa [1 ,2 ]
Lee, H. Y. [4 ]
机构：
[1] Natl Taiwan Univ, Dept Phys, Taipei 106, Taiwan
[2] Natl Taiwan Univ, Ctr Nanostorage Res, Taipei 106, Taiwan
[3] Acad Sinica, Inst Phys, Taipei 11529, Taiwan
[4] NSRRC, Hsinchu 300, Taiwan
来源：
SCRIPTA MATERIALIA | 2009年 / 61卷 / 07期
关键词：
Ordering; X-ray diffraction (XRD); Crystal structure; Magnetic recording thin films; CoPt L1(1) phase; CRYSTAL-STRUCTURE; ANISOTROPY; ALLOY; ORDER;
D O I：
10.1016/j.scriptamat.2009.06.011
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
CoPt thin films with a thickness of 50 nm were deposited on MgO(111) substrates by magnetron-sputtering at temperatures ranging from room temperature to 750 degrees C. A unique phase evolution of A] (disordered) -> L1(1) -> Al -> L1(0) was clearly identified by performing theta-2 theta scans at different psi angles using a Huber goniometer. The L1(1) CoPt phase with perpendicular magnetocrystalline anisotropy can be developed at 250 degrees C, thus making it a promising material for future ultra-high-density magnetic recording media. (C) 2009 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：713 / 716
页数：4
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