Positron implantation profiles in layered samples

被引：12

作者：

Dryzek, Jerzy ^{[1
,2
]}

Horodek, Pawel ^{[1
]}

机构：

[1] Inst Nucl Phys PAN, PL-31342 Krakow, Poland

[2] Univ Opole, Inst Phys, PL-45052 Opole, Poland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2009年 / 267卷 / 21-22期

关键词：

Positron annihilation; Interaction of positrons with matter; SIMULATION;

D O I：

10.1016/j.nimb.2009.08.020

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The paper presents theoretical and experimental studies of the positron implantation profiles in layered samples. The Monte Carlo simulations performed using the GEANT4 toolkit reveal accumulation of positrons in the denser layer embedded between two less dense layers. That effect is significant not only for low energy positrons at slow monoenergetic positron beams but also for high energy positrons which are emitted from radioactive nuclei in conventional experiments. Measurements of the positron implantation profile into the samples which consist of silver and aluminium foils of different thickness show profile features which Correspond well with those simulated by the GEANT4 toolkit for examined cases. We propose to call this phenomenon the accumulation effect of energetic positrons. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：3580 / 3589

页数：10

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