Raman polarization studies of highly oriented organic thin films

被引：21

作者：

Presser, V. ^{[2
]}

Schuster, B-E ^{[1
]}

Casu, M. B. ^{[1
]}

Heinemeyer, U. ^{[3
]}

Schreiber, F. ^{[3
]}

Nickel, K. G. ^{[2
]}

Chasse, T. ^{[1
]}

机构：

[1] Univ Tubingen, Inst Phys & Theoret Chem, D-72076 Tubingen, Germany

[2] Univ Tubingen, Inst Geosci, D-72074 Tubingen, Germany

[3] Univ Tubingen, Inst Appl Phys, D-72076 Tubingen, Germany

来源：

JOURNAL OF RAMAN SPECTROSCOPY | 2009年 / 40卷 / 12期

关键词：

diindenoperylene; polarized Raman spectroscopy; organic thin film; rutile; molecular orientation; THERMAL-STABILITY; ORIENTATION; METAMICTIZATION; SURFACES; GROWTH;

D O I：

10.1002/jrs.2361

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

In this work we report on the capability of polarized Raman spectroscopy to investigate the structure of thin organic films. Diindenoperylene (DIP) thin films on (1 x 1)-rutile(110) were prepared via organic molecular beam deposition (OMBD). Raman spectra of DIP thin films showed several strong Raman modes in the wavenumber region from 1200 to 1650 cm(-1). The A(g) mode at 1284 cm(-1) shows two contributions, thereby indicating the coexistence of at least two DIP film structures. Polarized Raman spectroscopy was applied to characterize the molecular orientation and the dominance of the sigma-configuration (i.e. upright standing DIP molecules) was found. Copyright (C) 2009 John Wiley & Sons, Ltd.

引用

页码：2015 / 2022

页数：8

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