The influence of strain on the diffusion of Si dimers on Si(001)

被引:24
|
作者
Zoethout, E
Gürlü, O
Zandvliet, HJW
Poelsema, B
机构
[1] Univ Twente, Dept Appl Phys, NL-7500 AE Enschede, Netherlands
[2] Univ Twente, MESA Res Inst, NL-7500 AE Enschede, Netherlands
关键词
scanning tunneling microscopy; silicon; surface diffusion;
D O I
10.1016/S0039-6028(00)00338-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The influence of lattice mismatch-induced tensile strain on the diffusion of Si dimers on Si(001) has been studied. The rate of surface diffusion of a Si dimer along the substrate dimer rows is relatively insensitive to tensile strain, whereas the rate of diffusion for a Si dimer across the substrate dimer rows is significantly enhanced. The insensitivity of the along row diffusion rate for tensile strain is attributed to the presence of a dissociative intermediate state of the ad-dimer during diffusion rather than diffusion as a solid unit. (C) 2000 Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码:247 / 252
页数:6
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