Morphology and structure of gold-lithium niobate thin film: A laboratory source X-ray scattering study

被引:14
|
作者
Hazra, S. [1 ]
机构
[1] Saha Inst Nucl Phys, Surface Phys Div, Kolkata 700064, W Bengal, India
关键词
thin film structure and morphology; X-ray diffraction and scattering; clusters; nanoparticles; and nanocrystalline materials; optical properties of nanocrystals and nanoparticles; GRAZING-INCIDENCE; OPTICAL-PROPERTIES; ABSORPTION; GROWTH; GLASS;
D O I
10.1016/j.apsusc.2006.04.017
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Laboratory source X-ray scattering set-up has been used to determine the complete morphology and structure of an optically important composite thin film. Analysis of grazing incidence small angle X-ray scattering, X-ray reflectivity and powder diffraction data of Au/LiNbO3 thin film prepared by sequential deposition of gold and lithium niobate on float glass substrate suggest that the Au-nanocrystallites are dispersed in amorphous medium, which although have average separation but do not have any long range periodicity other than growth or z-direction. The morphology of the nanocomposite thin film determined through X-ray scattering measurements agrees well with the measured optical absorption. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:2154 / 2157
页数:4
相关论文
共 50 条
  • [41] In-Situ Synchrotron X-Ray Scattering Study of Thin Film Growth by Atomic Layer Deposition
    Park, Yong Jun
    Lee, Dong Ryeol
    Lee, Hyun Hwi
    Lee, Han-Bo-Ram
    Kim, Hyungjun
    Park, Gye-Choon
    Rhee, Shi-Woo
    Baik, Sunggi
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2011, 11 (02) : 1577 - 1580
  • [42] Density fluctuations in molten lithium: inelastic x-ray scattering study
    Scopigno, T
    Balucani, U
    Ruocco, G
    Sette, F
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2000, 12 (37) : 8009 - 8034
  • [43] Orbital ordered structure of a manganite thin film observed by K-edge resonant X-ray scattering
    Wakabayashi, Y.
    Bizen, D.
    Nakao, H.
    Murakami, Y.
    Nakamura, M.
    Ogimoto, Y.
    Miyano, K.
    Sawa, H.
    SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2, 2007, 879 : 1711 - +
  • [44] Structure and growth of self-assembled thin-film materials probed by X-ray scattering.
    Salditt, T
    Vix, A
    An, QR
    Plech, A
    Eschbaumer, C
    Weidl, C
    Schubert, U
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 219 : U557 - U557
  • [45] The Absolute Calibration of a Small-Angle Scattering Instrument with a Laboratory X-ray Source
    Fan, Lixin
    Degen, Mike
    Bendle, Scott
    Grupido, Nick
    Ilavsky, Jan
    XIV INTERNATIONAL CONFERENCE ON SMALL-ANGLE SCATTERING (SAS09), 2010, 247
  • [46] Coherent dynamic structure factor of liquid lithium by inelastic x-ray scattering
    Sinn, H
    Sette, F
    Bergmann, U
    Halcoussis, C
    Krisch, M
    Verbeni, R
    Burkel, E
    PHYSICAL REVIEW LETTERS, 1997, 78 (09) : 1715 - 1718
  • [47] Inelastic X-ray scattering determination of the dynamic structure factor of liquid lithium
    Scopigno, T
    Balucani, U
    Cunsolo, A
    Masciovecchio, C
    Ruocco, G
    Sette, F
    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1999, 79 (11-12): : 2027 - 2035
  • [48] Inelastic X-ray scattering determination of the dynamic structure factor of liquid lithium
    Scopigno, T.
    Balucani, U.
    Cunsolo, A.
    Masciovecchio, C.
    Ruocco, G.
    Sette, F.
    Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties, 1999, 79 (11): : 2027 - 2035
  • [49] Study of the internal structure of lithium fluoride single crystal by laboratory X-ray topo-tomography
    D. A. Zolotov
    A. V. Buzmakov
    V. E. Asadchikov
    A. E. Voloshin
    V. N. Shkurko
    I. S. Smirnov
    Crystallography Reports, 2011, 56 : 393 - 396
  • [50] Study of the internal structure of lithium fluoride single crystal by laboratory X-ray topo-tomography
    Zolotov, D. A.
    Buzmakov, A. V.
    Asadchikov, V. E.
    Voloshin, A. E.
    Shkurko, V. N.
    Smirnov, I. S.
    CRYSTALLOGRAPHY REPORTS, 2011, 56 (03) : 393 - 396