Novel shared-path protection algorithm and reliability analysis model based on Bayesian network for multilink failures
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作者:
Xu, Jun
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Sun Yat Sen Univ, Sch Informat Sci & Technol, Guangzhou 510275, Guangdong, Peoples R ChinaSun Yat Sen Univ, Sch Informat Sci & Technol, Guangzhou 510275, Guangdong, Peoples R China
Xu, Jun
[1
]
Chang, Huiyou
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Sun Yat Sen Univ, Sch Informat Sci & Technol, Guangzhou 510275, Guangdong, Peoples R ChinaSun Yat Sen Univ, Sch Informat Sci & Technol, Guangzhou 510275, Guangdong, Peoples R China
Chang, Huiyou
[1
]
Xu, Chang
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Sun Yat Sen Univ, Sch Informat Sci & Technol, Guangzhou 510275, Guangdong, Peoples R ChinaSun Yat Sen Univ, Sch Informat Sci & Technol, Guangzhou 510275, Guangdong, Peoples R China
Xu, Chang
[1
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Yi, Yang
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Sun Yat Sen Univ, Sch Informat Sci & Technol, Guangzhou 510275, Guangdong, Peoples R ChinaSun Yat Sen Univ, Sch Informat Sci & Technol, Guangzhou 510275, Guangdong, Peoples R China
Yi, Yang
[1
]
机构:
[1] Sun Yat Sen Univ, Sch Informat Sci & Technol, Guangzhou 510275, Guangdong, Peoples R China
For the multilink failure problem of wavelength division multiplexing (WDM) optical networks, we establish a reliability analysis model of shared-path protection strategy based on the Bayesian network and correlated link failure probability and analyze the reliability of light paths assigned by two shared-path protection algorithms. The new reliability model makes the reliability calculation of path subject to multilink failures possible, greatly simplifying the calculation of probabilistic reasoning. In addition, based on the new Bayesian network reliability analysis model, a novel differentiated shared-path protection (DSPP) algorithm is proposed to protect against multilink failures in WDM optical networks. Simulation experiments show that, compared with the two previous shared-path protection algorithms, the DSPP algorithm not only can satisfy the specific requirements of users but also has better survivability for multilink failures. (C) 2009 Society of Photo-Optical Instrumentation Engineers. [DOI: 10.1117/1.3275451]