Structural, chemical and magnetic investigations of polycrystalline Zn1-xMnxO

被引:31
作者
Deshmukh, Alka V. [1 ]
Patil, S. I. [1 ]
Yusuf, S. M. [2 ]
Rajarajan, A. K. [2 ]
Lalla, N. P. [3 ]
机构
[1] Univ Pune, Ctr Adv Studies Mat Sci & Condensed Matter Phys, Dept Phys, Pune 411007, Maharashtra, India
[2] Bhabha Atom Res Ctr, Div Solid State Phys, Bombay 400085, Maharashtra, India
[3] UGC DAE Consortium Sci Res, Indore 452001, Madhya Pradesh, India
关键词
Doping; X-ray diffraction; Transmission electron microscopy (TEM); Magnetization measurement; MN-DOPED ZNO; THIN-FILMS; TEMPERATURE FERROMAGNETISM; ROOM-TEMPERATURE; SEMICONDUCTORS; SYSTEM; ABSENCE; ORIGIN; BULK;
D O I
10.1016/j.jmmm.2009.10.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Present study reports the detailed structural and magnetic, as well as chemical analysis of polycrystalline Zn1-xMnxO (where x=0, 0.005, 0.01, 0.03, 0.05 and 0.1) samples synthesized by the high-temperature solid state reaction route. X-ray diffraction studies reveal the presence of secondary phase for higher Mn-doping concentrations (x >= 0.03). Secondary phase formation having spinel structure is confirmed and reported as an evidence for the first time using transmission electron microscopy study. Chemical investigations using X-ray photoelectron spectroscopy showed the presence of Mn in two valence states. From the observed results we are of the opinion that Zn2+ ions, mainly present at or near grain boundaries, diffuse into manganese oxide to form a stable spinel phase ZnxMn3-xO4 at or near the grain boundaries of ZnO/Zn1-xMnxO. Magnetization measurements did not show any magnetic transition down to 5 K. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:536 / 541
页数:6
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