Comparison of Xilinx Virtex-II FPGA SEE sensitivities to protons and heavy ions

被引:42
作者
Koga, R [1 ]
George, J
Swift, G
Yui, C
Edmonds, L
Carmichael, C
Langley, T
Murray, P
Lanes, K
Napier, M
机构
[1] Aerosp Corp, El Segundo, CA 90245 USA
[2] Jet Prop Lab, Pasadena, CA 91109 USA
[3] Xilinx, San Jose, CA USA
[4] SEAKR Engn, Centennial, CO 80111 USA
[5] Sandia Natl Labs, Albuquerque, NM 87123 USA
关键词
field programmable gate array (FPGA); heavy ion radiation effects; proton radiation effects; semiconductor device testing; single event effects;
D O I
10.1109/TNS.2004.835057
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A comparison of heavy-ion and proton-induced single event effect sensitivities has been made using the Xilinx Virtex-II field programmable gate array (FPGA). Recently fabricated test samples are selected for observations of single event upset and single event functional interrupt. A complex relationship appears to exist between the heavy ion and proton sensitivities due to effects such as multiple-bit upsets and elastic nuclear scattering.
引用
收藏
页码:2825 / 2833
页数:9
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