Improving reliability engineering in product development based on design theory: the case of FMEA in the semiconductor industry

被引：20

作者：

Cabanes, Benjamin ^{[1
,2
]}

Hubac, Stephane ^{[3
]}

Le Masson, Pascal ^{[2
]}

Weil, Benoit ^{[2
]}

机构：

[1] Ecole Ponts ParisTech, Dept Ind Engn, F-77455 Champs Sur Marne, France

[2] PSL Univ, CGS Ctr Gest Sci, MINES ParisTech, I3 UMR CNRS 9217, F-75272 Paris, France

[3] STMicroelectronics, Front End Mfg & Proc R & Digital Sect, F-38920 Crolles, France

来源：

RESEARCH IN ENGINEERING DESIGN | 2021年 / 32卷 / 03期

关键词：

FMEA; Quality management; Reliability management; Operations management; Design theory; C-K design theory; PROCESS FAILURE MODE; BOUNDARY OBJECTS; AUTOMOTIVE INDUSTRY; ANALYSIS PFMEA; CREATIVITY; QUANTITY; QUALITY; IDEAS;

D O I：

10.1007/s00163-021-00360-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In industry, the failure mode and effect analysis (FMEA) methodology is one of the main tools used for reliability management in product design and development. However, the academic literature highlights several shortcomings of the FMEA methodology. Therefore, the main purposes of this paper are the analysis of the weaknesses of FMEA, the improvement of the method, and the implementation of a new methodology able to support quality and reliability management in a more efficient way. Motivated by these objectives, a formal new methodology is proposed by extending the classic FMEA methodology through C-K design theory. To test the effectiveness of the proposed approach and analyze the acceptance of this method by users, a case study is conducted in STMicroelectronics, one of the European leaders in the semiconductor industry.

引用

页码：309 / 329

页数：21

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