X-ray double-exposure holography

被引：0

作者：

Gao, HY ^{[1
]}

Chen, JW ^{[1
]}

Xie, HL ^{[1
]}

Xu, ZZ ^{[1
]}

机构：

[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China

来源：

X-RAY LASERS 2002 | 2002年 / 641卷

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Double-exposure holography for measuring phase information in X-ray fields is suggested in this paper. The double-exposure method cannot only obtain directly the phase information, but also gives qualitative and quantitative results. This means also that one can obtain simultaneous information about both the amplitude and phase in an experiment.

引用

页码：495 / 497

页数：3

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