I would like to express my sincere gratitude and the gratitude of the Electron Device Society (EDS) community at large to David Abe and Tian-Ling Ren, for their commitment, dedication and hard work during their six years of service on the Journal of Electron Devices editorial board. Our very best wishes to them in their future endeavors.
机构:
Structural Maintenance and Safety Laboratory, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, SwitzerlandStructural Maintenance and Safety Laboratory, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland
Brühwiler, Eugen
Proceedings of the ICE - Engineering History and Heritage,
2017,
170
(04):
: 163
-
165
机构:
Structural Maintenance and Safety Laboratory, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, SwitzerlandStructural Maintenance and Safety Laboratory, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland
Brühwiler, Eugen
Proceedings of the ICE - Engineering History and Heritage,
2017,
170
(04):
: 163
-
165