Reliability Analysis for Electronic Devices Using Beta Generalized Weibull Distribution

被引：11

作者：

Ali, Sajid ^{[1
]}

Ali, Shafaqat ^{[1
]}

Shah, Ismail ^{[1
]}

Khajavi, Ali Noori ^{[2
]}

机构：

[1] Quaid I Azam Univ, Dept Stat, Islamabad 45320, Pakistan

[2] Natl Iranian Oil Co, Tehran, Iran

来源：

IRANIAN JOURNAL OF SCIENCE AND TECHNOLOGY TRANSACTION A-SCIENCE | 2019年 / 43卷 / A5期

关键词：

Electronic devices; Beta generalized Weibull distribution; Bayesian estimation; Sensitivity analysis; Inverse power law; Voltage; Prior distribution;

D O I：

10.1007/s40995-019-00730-4

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

This study deals with the reliability analysis of electronic devices under different voltages assuming modified beta generalized Weibull distribution using power law rule. The parameters of the modified distribution are estimated using Bayesian inference as it allows to incorporate the prior information. Sensitivity of hyperparameters and selection of an appropriate probability model are also described within the study.

引用

收藏

页码：2501 / 2514

页数：14

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