Self-referenced sense amplifier for across-chip-variation immune sensing in high-performance content-addressable memories

被引：22

作者：

Arsovski, Igor ^{[1
]}

Wistort, Reid ^{[1
]}

机构：

[1] IBM Corp, Silicon Solut, Essex Jct, VT 05452 USA

来源：

PROCEEDINGS OF THE IEEE 2006 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 2006年

关键词：

D O I：

10.1109/CICC.2006.320819

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A memory sense-amplifier self-calibrates during sense-line precharge to reduce the required signal development and minimize data capture timing uncertainty caused by random device variation. When compared to conventional single-ended sensing, this method reduces sense time by 70% and decreases sense-power by 40%. The self-referenced sensing scheme (SRSS) is used to implement the search operation in Content-Addressable Memory (CAM) testchip. Fabricated in 1V 65nm CMOS, this scheme achieves a 0.6ns search time on a 70bit sense-line while consuming only 0.99 fJ/bit/search. Measured search access time on a five bank 64x240bit ternary CAM including selective precharge is 2.2ns. Measured power consumption at 450MHz is 10mW. Hardware shows robust search operation over a voltage range of 0.6V to 1.7V.

引用

页码：453 / 456

页数：4

共 7 条

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