Yield-Constrained Optimization Design Using Polynomial Chaos for Microwave Filters

被引:26
|
作者
Zhang, Zhen [1 ,2 ]
Chen, Hongcai [2 ]
Yu, Yang [2 ,3 ]
Jiang, Fan [2 ,4 ]
Cheng, Qingsha S. [2 ]
机构
[1] Harbin Inst Technol, Sch Elect & Informat Engn, Harbin 150001, Peoples R China
[2] Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China
[3] Univ Birmingham, Sch Elect Elect & Syst Engn, Birmingham B15 2TT, W Midlands, England
[4] Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Peoples R China
基金
中国国家自然科学基金;
关键词
Microwave filters; Yield estimation; Microwave theory and techniques; Band-pass filters; Mathematical model; Chaos; Optimization methods; Yield optimization; polynomial chaos; microwave filters; ROBUST OPTIMIZATION; SENSITIVITY;
D O I
10.1109/ACCESS.2021.3055581
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Yield optimization aims at finding microwave filter designs with high yield under fabrication tolerance. The electromagnetic (EM) simulation-based yield optimization methods are computationally expensive because a large number of EM simulations is required. Moreover, the microwave filter design usually requires several performance objectives to be met, which is not considered by the current yield optimization methods for microwave filters. In this paper, an efficient yield-constrained optimization using polynomial chaos surrogates (YCOPCS) is employed for microwave filters considering multiple objectives. In the YCOPCS method, the low-cost and high-accuracy of polynomial chaos is used as a surrogate. An efficient yield-constrained design framework is implemented to obtain the optimal design solution. Two numerical examples demonstrate the performance of the YCOPCS method, including a coupling matrix model of a fourth-order filter with cascaded quadruplet topology and an EM simulation model of a microwave waveguide bandpass filter. The numerical results show that the YCOPCS method can obtain the filter designs with higher yield and reduce EM simulations by 80% compared to Monte Carlo-based yield optimization in all testing examples.
引用
收藏
页码:22408 / 22416
页数:9
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