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An atomic force microscopy study of asphaltenes on mica surfaces.: Influence of added resins and demulsifiers
被引:54
作者:
Ese, MH
Sjöblom, J
Djuve, J
Pugh, R
机构:
[1] Univ Bergen, Dept Chem, N-5007 Bergen, Norway
[2] Statoil AS, R&D Ctr, N-7005 Trondheim, Norway
[3] Inst Surface Chem, S-11486 Stockholm, Sweden
关键词:
asphaltenes;
resins;
Langmuir-Blodgett;
mica;
atomic force microscopy;
D O I:
10.1007/s003960050551
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
Monolayers of asphaltene and resins on the water surface have been transferred at a surface pressure of 10 mN/m onto mica substrates using the Langmuir-Blodgett technique. Atomic force microscopy (AFM) has been used to examine the topography of these layers. Monolayers consisting of pure asphaltene fractions provide a rigid him with a close-packed structure, while the resins build up a continuous open network. Mixed films of these two fractions show that a gradual increase in resin concentration leads to an opening of the rigid asphaltene structure towards a more resin like configuration. Increased aggregation when the two heavy functions are present in one film is seen as larger individual units in the AFM pictures. Addition of high-molecular-weight demulsifiers/inhibitors results in the same kind of influence on the asphaltene film as seen with the resins.
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页码:532 / 538
页数:7
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