Surge Current Capability in lateral AlGaN/GaN Hybrid Anode Diodes with p-GaN/Schottky Anode

被引:0
|
作者
Atmaca, Gokhan [1 ]
Jaud, Marie-Anne [1 ]
Buckley, Julien [1 ]
Biscarrat, Jerome [1 ]
Gwoziecki, Romain [1 ]
Plissonnier, Marc [1 ]
Poiroux, Thierry [1 ]
Yvon, Arnaud [2 ]
Collard, Emmanuel [2 ]
机构
[1] Univ Grenoble Alpes, CEA, LETI, MINATEC Campus, Grenoble, France
[2] STMicroelectronics, 10 Rue Thales Milet, F-37071 Tours, France
关键词
hybrid anode diodes; hole injection; surge current; tcad;
D O I
10.23919/sispad49475.2020.9241673
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In lateral power diodes, the conductivity modulation mechanism can pave the way to the demonstration of surge current capability. In a Hybrid Anode Diode concept with a p-GaN layer, an anode contact on p-GaN layer can be a source of hole injection that increases the electron density at AlGaN/GaN interface. The role of p-GaN layer on the surge current capability and its demonstration are investigated through TCAD simulations that explain the role of hole barrier tunneling at anode metal/p-GaN interface. These simulations show that surge current can occur in case of Ohmic p-GaN contact as the injected holes can lead to create additional electron density in the channel as well as a hole current to support the total diode current.
引用
收藏
页码:233 / 236
页数:4
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