A high-density, matched hexagonal transistor structure in standard CMOS technology for high-speed applications

被引:16
作者
Van den Bosch, A [1 ]
Steyaert, MSJ [1 ]
Sansen, W [1 ]
机构
[1] Catholic Univ Louvain, ESAT MICAS, B-3001 Heverlee, Belgium
关键词
CMOS; matching; transistor modeling;
D O I
10.1109/66.843632
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, a very dense CMOS hexagonal transistor structure is presented. The main advantages of the transistors are the low parasitic drain and source capacitance caused by the small area. The matching properties of this structure have been investigated, and these results have been compared with those for traditional finger-style structures. Exploiting the advantages, these transistors are very well suited for high-speed applications with a demand for both good matching and a small area, such as multibit current steering D/A converters or wireless applications, The test chips have been implemented in a standard 0.5-mu m CMOS technology. No adaptations to the standard technology have been made to realize the structures.
引用
收藏
页码:167 / 172
页数:6
相关论文
共 10 条
[1]  
BASTOS J, 1998, THESIS CATHOLIC U LE
[2]  
BASTOS J, 1996, P IEEE INT C MICR TE, P17
[3]  
ELZINGA H, 1996, P IEEE INT C MICR TE, P173
[4]  
GRAY PR, 1993, ANAL DESIGN ANALOG I, pCH1
[5]   MODELING OF MOS-TRANSISTORS WITH NON-RECTANGULAR-GATE GEOMETRIES [J].
GRIGNOUX, P ;
GEIGER, RL .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (08) :1261-1269
[6]  
LAKER KR, 1994, DESIGN ANALOG INTEGR, pCH1
[7]   MATCHING PROPERTIES OF MOS-TRANSISTORS [J].
PELGROM, MJM ;
DUINMAIJER, ACJ ;
WELBERS, APG .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1989, 24 (05) :1433-1440
[8]  
VANDENBOSCH A, 1999, P IEEE INT C EL CIRC, P1193
[10]  
WONG SC, 1995, P IEEE INT C MICR TE, P171