Prototype of phase-change channel transistor for both nonvolatile memory and current control

被引:10
作者
Hosaka, Sumio [1 ]
Miyauchi, Kunihiro
Tamura, Takuro
Yin, You
Sone, Hayato
机构
[1] Gunma Univ, Grad Sch Engn, Dept Nanomat Syst, Kiryu, Gunma 3768515, Japan
[2] Gunma Univ, Dept Elect Engn, Kiryu, Gunma 3768515, Japan
[3] Ricoh Co Ltd, Tokyo 1048222, Japan
[4] Gunma Univ, Grad Sch Engn, Dept Nanomat Syst, Kiryu, Gunma 3768515, Japan
关键词
annealing; channel current control; GeSbTe; melting; nonvolatile memory; one-transistor cell; phase change (PC);
D O I
10.1109/TED.2006.890386
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We prototyped phase-change (PC) channel transistors and demonstrated two functions of nonvolatile memory and channel current control. We have developed prototype transistors that use a PC channel instead of a silicon channel. The PC material of a Ge2Sb2Te5 thin film with a thickness of 50 nm was used. We demonstrated a memory function whereby we achieved a reversible change between the crystalline and amorphous phases by applying a source-drain (SD) voltage for Joule heating. In the experiment, the applied voltages for PC between amorphous and crystalline phases were from 5 to 8 V. Control of the channel current was realized by applying a gate bias. The SD current was suppressed to less than 1/20 of that at a gate bias of -3 V by applying a gate bias of 0-3 V.
引用
收藏
页码:517 / 523
页数:7
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