Vacancy defects and the formation of local haeckelite structures in graphene from tight-binding molecular dynamics

被引:78
作者
Lee, Gun-Do [1 ]
Wang, C. Z.
Yoon, Euijoon
Hwang, Nong-Moon
Ho, K. M.
机构
[1] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea
[2] Seoul Natl Univ, Interuniv Semicond Res Ctr, ISRC, Seoul 151742, South Korea
[3] Seoul Natl Univ, Sch Mat Sci & Engn, Natl Res Lab Charged Nanoparticles, Seoul 151742, South Korea
[4] Iowa State Univ, Ames Lab, Ames, IA 50011 USA
[5] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA
来源
PHYSICAL REVIEW B | 2006年 / 74卷 / 24期
关键词
D O I
10.1103/PhysRevB.74.245411
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The dynamics of multivacancy defects in a graphene layer is investigated by tight-binding molecular dynamics simulations and by first principles calculation. The simulations show that four single vacancies in the graphene layer first coalesce into two double vacancies, each consisting of a pentagon-heptagon-pentagon (5-8-5) defective structure. While one of the 5-8-5 defects further reconstructs into a 555-777 defect, which is composed of three pentagonal rings and three heptagonal rings, another 5-8-5 defect diffuses toward the reconstructed 555-777 defect. During the 5-8-5 defect diffusion process, three interesting mechanisms, i.e., "dimer diffusion," "chain diffusion," and "single atom diffusion," are observed. Finally, the four single vacancies reconstruct into two adjacent 555-777 defects, which is a local haeckelite structure.
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页数:5
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