Atom-Based RF Electric Field Measurements: An Initial Investigation of the Measurement Uncertainties

被引：0

作者：

Holloway, Christopher L. ^{[1
]}

Gordon, Joshua A. ^{[1
]}

Simons, Matt T. ^{[1
]}

Fan, Haoquan ^{[2
]}

Kumar, Santosh ^{[2
]}

Shaffer, James P. ^{[2
]}

Anderson, David A. ^{[3
]}

Schwarzkopf, Andrew ^{[3
]}

Miller, Stephanie A. ^{[3
]}

Thaicharoen, Nithiwadee ^{[3
]}

Raithel, Georg ^{[3
]}

机构：

[1] NIST, Electromagnet Div, 325 Broadway, Boulder, CO 80305 USA

[2] Univ Oklahoma, Dept Phys, Norman, OK 73019 USA

[3] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA

来源：

2015 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC) | 2015年

关键词：

RYDBERG ATOMS; MICROWAVE;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We discuss a new method for the measurement of electric (E) fields that will lead to a self-calibrating, direct SI-traceable E-field probe. The technique is based on radio frequency E-field interactions with alkali atoms placed in glass cells. After we present the concept of this approach and present some experimental data to show its validity, we give a discussion of the different types of uncertainties that are associated with this new approach. We discuss how the uncertainties of this approach compare to commonly used E-field measurement techniques.

引用

页码：467 / 472

页数：6