Atom-Based RF Electric Field Measurements: An Initial Investigation of the Measurement Uncertainties

被引:0
|
作者
Holloway, Christopher L. [1 ]
Gordon, Joshua A. [1 ]
Simons, Matt T. [1 ]
Fan, Haoquan [2 ]
Kumar, Santosh [2 ]
Shaffer, James P. [2 ]
Anderson, David A. [3 ]
Schwarzkopf, Andrew [3 ]
Miller, Stephanie A. [3 ]
Thaicharoen, Nithiwadee [3 ]
Raithel, Georg [3 ]
机构
[1] NIST, Electromagnet Div, 325 Broadway, Boulder, CO 80305 USA
[2] Univ Oklahoma, Dept Phys, Norman, OK 73019 USA
[3] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA
来源
2015 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC) | 2015年
关键词
RYDBERG ATOMS; MICROWAVE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We discuss a new method for the measurement of electric (E) fields that will lead to a self-calibrating, direct SI-traceable E-field probe. The technique is based on radio frequency E-field interactions with alkali atoms placed in glass cells. After we present the concept of this approach and present some experimental data to show its validity, we give a discussion of the different types of uncertainties that are associated with this new approach. We discuss how the uncertainties of this approach compare to commonly used E-field measurement techniques.
引用
收藏
页码:467 / 472
页数:6
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