Surface X-ray diffraction study of boron-nitride nanomesh in air

被引：51
作者：
Bunk, O. [1 ]
Corso, M.
Martoccia, D.
Herger, R.
Willmott, P. R.
Patterson, B. D.
Osterwalder, J.
van der Veen, If
Greber, T.
机构：
[1] Paul Scherrer Inst, Res Dept Synchrotron Radiat & Nanotechnol, CH-5232 Villigen, Switzerland
[2] Univ Zurich, Inst Phys, CH-8057 Zurich, Switzerland
[3] ETH, CH-8093 Zurich, Switzerland
来源：
SURFACE SCIENCE | 2007年 / 601卷 / 02期
关键词：
surface X-ray diffraction; boron-nitride; rhodium; nanomesh;
D O I：
10.1016/j.susc.2006.11.018
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The hexagonal boron-nitride 'nanomesh' surface reconstruction on Rh(111) [Corso et al., Science 303 (2004) 217-220] has been investigated using surface X-ray diffraction utilizing synchrotron radiation. This unique structure has been found to be stable under ambient atmosphere which provides an important basis for technological applications like templating and coating. The previously suggested (12 x 12) periodicity of this reconstruction has been unambiguously confirmed and structural features are discussed in the light of the X-ray diffraction results. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码：L7 / L10
页数：4
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