Interdependencies of Degradation Effects and Their Impact on Computing

被引：9

作者：

Amrouch, Hussam ^{[1
]}

van Santen, Victor M. ^{[1
]}

Henkel, Joerg ^{[1
]}

机构：

[1] KIT, Chair Embedded Syst, Karlsruhe, Germany

来源：

IEEE DESIGN & TEST | 2017年 / 34卷 / 03期

关键词：

SIMULATION;

D O I：

10.1109/MDAT.2016.2594180

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Process variations, aging and wearout, are nonidealities that lead to suboptimal system performance and increased power. In order to understand the effects of these degradation effects, until now, researchers have investigated them thoroughly, but separately from each other. What this article shows is that process variations and wearout are not independent from each other and they need to be considered together. The article shows designers how they can sometimes take advantage of these interdependencies to safely reduce design margins, while in other cases, it is possible that the interdependencies conspire to amplify the effect of the degradation effects in catastrophic ways. - Mircea Stan, University of Virginia. © 2013 IEEE.

引用

页码：59 / 67

页数：9

共 15 条

[1] Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack [J].