GABOR-BASED PATCH COVARIANCE MATRIX FOR FACE SKETCH SYNTHESIS

被引:0
作者
Guan, Jian [1 ]
Hu, Ruimin [1 ]
Jiang, Junjun [1 ]
Han, Zhen [1 ]
机构
[1] Wuhan Univ, Natl Engn Res Ctr Multimedia Software, Sch Comp, Wuhan 430072, Peoples R China
来源
2014 IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING (ICIP) | 2014年
关键词
sketch/photo synthesis; Gabor; covariance matrix; Stein divergence;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
In this paper, we propose a novel face sketch/photo synthesis method by utilizing Gabor-based Patch Covariance Matrix (GPCM) as face descriptor, a.k.a. symmetric positive definite matrix, which lie on a Riemannian manifold. In particular, both pixel locations and Gabor coefficients of one patch are employed to form the covariance matrix. In this way, the sketch/photo can be then transformed from the pixel space to the Riemannian manifold space. With the aid of the recently introduced Stein kernel theory, we advance to perform Regularized Least Square Representation (RLSR) in Stein space. Based on the assumption that the Stein divergence manifold of photo/sketch patch and the sketch/photo share the same topology, a new sketch/photo patch of the same position can be synthesized by keeping the weights and replacing the photo/sketch training image patches with the corresponding sketch/photo ones. Experimental results demonstrate the superiority of the proposed method.
引用
收藏
页码:4642 / 4646
页数:5
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