Photoreflectance spectroscopy of low-dimensional semiconductor structures

In this paper; we present the applications of photoreflectance spectroscopy for investigations of low-dimensional, semiconductor structures. We briefly introduce the theoretical background of this technique including the line-shape expressions related to semiconductor, microstructures. We show examples of photoreflectance investigations of two-dimensional structures such as quantum wells, multiple quantum wells and superlattices, one-dimensional structures - quantum wires, and quasi zero-dimensional structures - quantum dots. Finally, we concentrate our attention on investigations of the structures of semiconductor devices like high electron mobility transistors, heterojunction bipolar transistors and vertical/planar light emitting laser structures.