Structure of ultrathin Pd films determined by low-energy electron microscopy and diffraction

被引：15
作者：
Santos, B. [1 ,2 ]
Puerta, J. M. [3 ]
Cerda, J. I. [3 ]
Herranz, T. [2 ]
McCarty, K. F. [4 ]
de la Figuera, J. [1 ,2 ]
机构：
[1] Univ Autonoma Madrid, Ctr Microanal Mat, E-28049 Madrid, Spain
[2] CSIC, Inst Quim Fis Rocasolano, E-28006 Madrid, Spain
[3] CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain
[4] Sandia Natl Labs, Livermore, CA 94550 USA
来源：
NEW JOURNAL OF PHYSICS | 2010年 / 12卷
关键词：
SURFACE; LEED; MORPHOLOGY; PALLADIUM; W(110); LAYERS; ORDER; CO;
D O I：
10.1088/1367-2630/12/2/023023
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Palladium (Pd) films have been grown and characterized in situ by low-energy electron diffraction (LEED) and microscopy in two different regimes: ultrathin films 2-6 monolayers (ML) thick on Ru(0001), and similar to 20 ML thick films on both Ru(0001) and W(110). The thinner films are grown at elevated temperature (750 K) and are lattice matched to the Ru(0001) substrate. The thicker films, deposited at room temperature and annealed to 880 K, have a relaxed in-plane lattice spacing. All the films present an fcc stacking sequence as determined by LEED intensity versus energy analysis. In all the films, there is hardly any expansion in the surface-layer interlayer spacing. Two types of twin-related stacking sequences of the Pd layers are found on each substrate. On W(110) the two fcc twin types can occur on a single substrate terrace. On Ru(0001) each substrate terrace has a single twin type and the twin boundaries replicate the substrate steps.
引用
收藏
页数：21
相关论文
共 50 条
[21]   Determination and correction of distortions and systematic errors in low-energy electron diffraction [J].
Sojka, Falko ;
Meissner, Matthias ;
Zwick, Christian ;
Forker, Roman ;
Fritz, Torsten .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (01)
[22]   Thickness monitoring of graphene on SiC using low-energy electron diffraction [J].
Fisher, P. J. ;
Luxmi ;
Srivastava, N. ;
Nie, S. ;
Feenstra, R. M. .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2010, 28 (04) :958-962
[23]   The role of an energy-dependent inner potential in quantitative low-energy electron diffraction [J].
Walter, S ;
Blum, V ;
Hammer, I ;
Müller, S ;
Heinz, K ;
Giesen, M .
SURFACE SCIENCE, 2000, 458 (1-3) :155-161
[24]   Reactive growth of MgO overlayers on Fe(001) surfaces studied by low-energy electron diffraction and atomic force microscopy [J].
Tekiel, Antoni ;
Fostner, Shawn ;
Topple, Jessica ;
Miyahara, Yoichi ;
Gruetter, Peter .
APPLIED SURFACE SCIENCE, 2013, 273 :247-252
[25]   Spectroscopic photoemission and low-energy electron microscopy studies of the surface and electronic structure of two-dimensional materials [J].
Jin, Wencan ;
Osgood, Richard M. .
ADVANCES IN PHYSICS-X, 2019, 4 (01)
[26]   Growth and low-energy electron microscopy characterizations of graphene and hexagonal boron nitride [J].
Hibino, H. ;
Wang, S. ;
Orofeo, C. M. ;
Kageshima, H. .
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 2016, 62 (02) :155-176
[27]   Intensity-voltage low-energy electron microscopy for functional materials characterization [J].
Flege, Jan Ingo ;
Krasovskii, Eugene E. .
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2014, 8 (06) :463-477
[28]   Molecular surface structure of ice(0001): Dynamical low-energy electron diffraction, total-energy calculations and molecular dynamics simulations [J].
Materer, N ;
Starke, U ;
Barbieri, A ;
VanHove, MA ;
Somorjai, GA ;
Kroes, GJ ;
Minot, C .
SURFACE SCIENCE, 1997, 381 (2-3) :190-210
[29]   Surface structures of Ni2P (0001) -: scanning tunneling microscopy (STM) and low-energy electron diffraction (LEED) characterizations [J].
Moula, Md. Golam ;
Suzuki, Shushi ;
Chun, Wang-Jae ;
Otani, Shigeki ;
Oyama, S. Ted ;
Asakura, Kiyotaka .
SURFACE AND INTERFACE ANALYSIS, 2006, 38 (12-13) :1611-1614
[30]   Ultrafast low-energy electron diffraction in transmission resolves polymer/graphene superstructure dynamics [J].
Gulde, Max ;
Schweda, Simon ;
Storeck, Gero ;
Maiti, Manisankar ;
Yu, Hak Ki ;
Wodtke, Alec M. ;
Schaefer, Sascha ;
Ropers, Claus .
SCIENCE, 2014, 345 (6193) :200-204
12345