LED beam shaping lens based on the near-field illumination

被引：24

作者：

Joo, Jae Young ^{[1
]}

Kang, Chang Seog ^{[2
]}

Park, Soon Sub ^{[2
]}

Lee, Sun-Kyu ^{[1
]}

机构：

[1] Gwangju Inst Sci & Technol, Dept Mechatron, Kwangju 500712, South Korea

[2] Korea Inst Ind Technol, Honam Technol Serv Div, Kwangju 500480, South Korea

来源：

OPTICS EXPRESS | 2009年 / 17卷 / 26期

关键词：

LIGHT-EMITTING-DIODES; PATTERN; SYSTEM;

D O I：

10.1364/OE.17.023449

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

This paper presents a novel method in near-field beam shaping based on the precise optical modeling of a gallium nitride light-emitting diode (GaN LED). A Monte Carlo ray tracing simulation has been utilized to calculate the spatial photon distribution near the LED's top. By analyzing the ray data in near-field, the miniaturized lens profile is created and machined with aspherical surfaces and total internal reflection (TIR) Fresnel facets. The prototype lens reduce the viewing angle of the LED from 150 degrees to 17.5 degrees at full width half maximum (FWHM) while increasing the peak luminous intensity 10 times. The array of proposed lens with CSP LEDs exhibits feasibility of ultra thin uniform illumination in near-field. (C) 2009 Optical Society of America

引用

页码：23449 / 23458

页数：10

共 20 条

[1]

ASHDOWN I, 2006, P SPIE, V6342

[2] Miniaturised optical encoder for ultra precision metrology systems [J].

Carr, J. ;

Desmulliez, M. Y. P. ;

Weston, N. ;

McKendrick, D. ;

Cunningham, G. ;

McFarland, G. ;

Meredith, W. ;

Mckee, A. ;

Langton, C. .

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2009, 33 (03) :263-267

[3]

Carves J., 2008, INTRO NONIMAGING OPT

[4]

DAVID A, 2006, APPL PHYS LETT, V86

[5] Freeform LED lens for uniform illumination [J].

Ding, Yi ;

Liu, Xu ;

Zheng, Zhen-rong ;

Gu, Pei-fu .

OPTICS EXPRESS, 2008, 16 (17) :12958-12966

[6]

GIEL BV, 2006, P SPIE, V6196

[7] Dislocation-related optical absorption in plastically deformed GaN [J].

Hasegawa, Hiroki ;

Kamimura, Yasushi ;

Edagawa, Keiichi ;

Yonenaga, Ichiro .

JOURNAL OF APPLIED PHYSICS, 2007, 102 (02)

[8] Far-field pattern simulation of flip-chip bonded power light-emitting diodes by a Monte Carlo photon-tracing method [J].

Hu, F ;

Qian, KY ;

Luo, Y .

APPLIED OPTICS, 2005, 44 (14) :2768-2771

[9]

KWON YH, 2008, Patent No. 7569423

[10] Light extraction analysis of GaN-based light-emitting diodes with surface texture and/or patterned substrate [J].

Lee, Tsung-Xian ;

Gao, Ko-Fon ;

Chien, Wei-Ting ;

Sun, Ching-Cherng .

OPTICS EXPRESS, 2007, 15 (11) :6670-6676

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