Electronic structure of (Ge2Sb2Te5)1-x(In3SbTe2)x investigated by x-ray photoelectron spectroscopy

被引:5
|
作者
Benayad, Anass [1 ]
Kang, YounSeon [2 ]
Shin, Hyun-Joon [3 ]
Kim, Kihong [1 ]
Suh, Dong-Seok [2 ]
Kim, KiJoon [2 ]
Kim, CheolKyu [2 ]
Lee, Tae-Yon [2 ]
Noh, Jin-Seo [2 ]
Lee, JaeCheol [1 ]
Khang, YoonHo [2 ]
机构
[1] Samsung Elect Co Ltd, SAIT, Analyt Engn Grp, Suwon 440600, South Korea
[2] Samsung Elect Co Ltd, SAIT, Semicond Device Lab, Suwon 440600, South Korea
[3] Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang 790784, South Korea
关键词
CRYSTAL-STRUCTURE; OPTICAL DISK; THIN-FILMS; PHASE; PHOTOEMISSION; IONICITY; STORAGE; MEMORY; INTE; GETE;
D O I
10.1063/1.3190500
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the core levels and the valence band of (Ge2Sb2Te5)(1-x)(In3Sb1Te2)(x) quaternary phase system (IGST) by means of x-ray photoelectron spectroscopy. A systematic shift of Sb 3d and Ge 2p core-level peaks toward lower binding energies side was observed with increasing indium amount, whereas the In 3d and Te 3d core peaks showed less change. The Sb 3d and Ge 2p core-level shift is attributed to an increase in the electronic charge of p-electrons dependent of indium amount. The valence band spectra show a distinct change in the sp, configuration with indium concentration change. The change in the local bonding as the indium amount increase has a profound impact on both local atomic arrangement and amorphous-to-crystal line transformation temperature. The difference in the photoemission spectra have been discussed according to a simple structural model suggesting that the Na site in IGST can be occupied by Te, Sb, In, and vacancy, whereas in GST it is occupied only by Te. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3190500]
引用
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页数:6
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