Rapid Mueller matrix polarimetry based on parallelized polarization state generation and detection

被引:47
作者
Tripathi, Santosh [1 ]
Toussaint, Kimani C., Jr. [2 ,3 ,4 ]
机构
[1] Univ Illinois, Dept Elect & Comp Engn, Lab Photon Res Bio Nano Environm PROBE, Urbana, IL 61801 USA
[2] Univ Illinois, Dept Mech Sci & Engn, Urbana, IL 61801 USA
[3] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
[4] Univ Illinois, Dept Bioengn, Urbana, IL 61801 USA
关键词
OPTICAL VECTOR BEAMS; SPECTROSCOPIC ELLIPSOMETRY; ELECTROMAGNETIC DIFFRACTION; LIQUID-CRYSTALS; IMAGE FIELD; FORMULATION; CALIBRATION; SURFACES; SYSTEMS; DESIGN;
D O I
10.1364/OE.17.021396
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present rapid Mueller matrix polarimetry that can extract twelve Muller matrix elements from a single intensity image in real time and with high spatial resolution. This is achieved by parallelizing the respective polarization state generation and polarization state detection processes, which in existing polarimeters is performed sequentially. Parallelization of the polarization state generation process is accomplished through the use of vector beams, for which this work represents a new application domain. Polarization state detection is parallelized by uniquely combining a microscope/array detector setup with a specialized algorithm that simultaneously utilizes information from multiple spatial regions of the array detector. Simulated results applying this technique to two anisotropic samples including metamaterial yield material parameters that are consistent with those reported in the literature. (C) 2009 Optical Society of America
引用
收藏
页码:21396 / 21407
页数:12
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