Comparative characteristics of thick-film integrated LC filters

被引：12

作者：

Desnica, VD ^{[1
]}

Zivanov, LD ^{[1
]}

Aleksic, OS ^{[1
]}

Lukovic, MD ^{[1
]}

Nimrihter, MD ^{[1
]}

机构：

[1] Univ Novi Sad, Fac Engn, YU-21000 Novi Sad, Yugoslavia

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2002年 / 51卷 / 04期

关键词：

EMI/EMC thick-film filters; insertion loss measurements; modeling and simulation;

D O I：

10.1109/TIM.2002.802238

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The paper describes the design, fabrication, and test of integrated LC filters in thick-film technology. The range of filters was electrically characterized using the HP 8566B network analyzer. We present a scalable analytical model for thick-film integrated LC filters that is suitable for design and circuit simulations. We also provide simple expressions for evaluating the optimum conductor thicknesses.

引用

页码：570 / 576

页数：7

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