Direct observation of helical polysilane nanostructures by atomic force microscopy

被引:38
作者
Ebihara, E
Koshihara, S
Yoshimoto, M
Maeda, T
Ohnishi, T
Koinuma, H
Fujiki, M
机构
[1] TOKYO INST TECHNOL, MAT & STRUCT LAB, MIDORI KU, YOKOHAMA, KANAGAWA 226, JAPAN
[2] NIPPON TELEGRAPH & TEL PUBL CORP, BASIC RES LABS, ATSUGI, KANAGAWA 24301, JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1997年 / 36卷 / 9AB期
关键词
polysilane; atomic force microscopy; single molecule; nanostructure; ultrasmooth sapphire substrate;
D O I
10.1143/JJAP.36.L1211
中图分类号
O59 [应用物理学];
学科分类号
摘要
The nanostructure of a single quantum wire of the silicon: poly[n-decyl-(S)-2-methylbutylsilane] molecule on a hydrophobic ultrasmooth sapphire plate has been observed by atomic force microscopy (AFM). The backbone structure of this molecule is considered to be a rigid rodlike helix and to be fixed securely into a preferential single-screw-sense. The obtained result of the AFM shows that the polysilane molecule, with a length of about 2 mu m, consists of very long rod-like segments linked by kinks as expected for this backbone structure. Networklike aggregated nanostructures of these molecules were also observed for the sample prepared from concentrated solvents.
引用
收藏
页码:L1211 / L1213
页数:3
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