The role of surface roughness in total internal reflection ellipsometry of hybrid systems

被引：20

作者：

Balevicius, Z. ^{[1
]}

Vaicikauskas, V.

Babonas, G. -J. ^{[2
]}

机构：

[1] Inst Phys, Nonlinear Opt & Spect Lab, LT-02300 Vilnius, Lithuania

[2] Inst Semicond Phys, LT-01108 Vilnius, Lithuania

来源：

APPLIED SURFACE SCIENCE | 2009年 / 256卷 / 03期

关键词：

Total internal reflection ellipsometry; Spectroscopic ellipsometry; Surface plasmons; Self-assembled monolayers; Octadecanethiole; SELF-ASSEMBLED MONOLAYERS; FILMS; MODEL; GOLD;

D O I：

10.1016/j.apsusc.2009.08.033

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Total internal reflection ellipsometry (TIRE) technique was used to investigate the role of surface roughness in the hybrid system composed of octadecanethiole layer on Au thin film. The samples with Au films of different microstructure were explored. The experimental results were interpreted in the model, which took into account the surface roughness of Au film in the hybrid system. It was shown that optical parameters of octadecanethiole were in correspondence for samples of different microstructure in the case of adequate models used for interpretation of TIRE data. (c) 2009 Elsevier B.V. All rights reserved.

引用

页码：640 / 644

页数：5

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