Grain-boundary and crack effects on the dielectric response of high-permittivity films and ceramics

被引：54

作者：

Rychetsky, I ^{[1
]}

Petzelt, J ^{[1
]}

Ostapchuk, T ^{[1
]}

机构：

[1] Acad Sci Czech Republ, Inst Phys, Prague 18221 8, Czech Republic

来源：

APPLIED PHYSICS LETTERS | 2002年 / 81卷 / 22期

关键词：

D O I：

10.1063/1.1525394

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Grain-boundary and crack effects on the dielectric response of high-permittivity films and ceramics were analyzed using the generalized effective-medium approximation. It was demonstrated that the brick-wall and coated spheres models, which become equivalent for a small porosity, best describe the strong reduction of the dielectric response and hardening of the soft-mode frequency recently revealed in SrTiO3 films and PbZrO3 ceramics. (C) 2002 American Institute of Physics.

引用

页码：4224 / 4226

页数：3

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