A low-temperature scanning force microscope for investigating buried two-dimensional electron systems under quantum Hall conditions

被引：23
作者：
Weitz, P [1 ]
Ahlswede, E [1 ]
Weis, J [1 ]
Von Klitzing, K [1 ]
Eberl, K [1 ]
机构：
[1] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
来源：
APPLIED SURFACE SCIENCE | 2000年 / 157卷 / 04期
关键词：
scanning probe microscopy; Kelvin probe force microscopy; quantum Hall effect;
D O I：
10.1016/S0169-4332(99)00550-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
A low-temperature scanning force microscope sensitive to electrostatics has been constructed for investigating a two-dimensional electron system (2DES) under quantum Hall conditions. In order to cope with the highly resistive properties of the 2DES under these conditions, a low-frequency measurement technique is presented, based on the shift of the cantilever's resonance frequency induced by a small ac current modulation within the 2DES. Since the 2DES is buried in a GaAs/AlGaAs heterostructure, a special calibration technique has to be applied, which allows to map Hall-potential profiles with clearly submicron resolution (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：349 / 354
页数：6
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