Phase imaging using highly coherent X-rays:: radiography, tomography, diffraction topography

被引:40
|
作者
Baruchel, J
Cloetens, P
Härtwig, J
Ludwig, W
Mancini, L
Pernot, P
Schlenker, M
机构
[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[2] CNRS, Lab Louis Neel, F-38042 Grenoble, France
关键词
X-ray coherence; phase-sensitive imaging; tomography; holotomography; diffraction topography;
D O I
10.1107/S0909049500002995
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Several hard X-rays imaging techniques greatly benefit from the coherence of the beams delivered by the modern synchrotron radiation sources. This is illustrated with examples recorded on the 'long' (145 m) ID19 'imaging' beamline of the ESRF. Phase imaging is directly related to the small angular size of the source as seen from one point of the sample ('effective divergence' similar or equal to microradians). When using the 'propagation' technique, phase radiography and tomography are instrumentally very simple. They are often used in the 'edge detection' regime, where the jumps of density are clearly observed. The in situ damage assessment of micro-heterogeneous materials is one example of the many applications. Recently a more quantitative approach has been developed, which provides a three-dimensional density mapping of the sample ('holotomography'). The combination of diffraction topography and phase-contrast imaging constitutes a powerful tool. The observation of holes of discrete sizes in quasicrystals, and the investigation of poled ferroelectric materials, result from this combination.
引用
收藏
页码:196 / 201
页数:6
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