Nanotribological characterization of industrial polytetrafluorethylene-based coatings by atomic force microscopy

被引：10
作者：
Podestà, A
Fantoni, G
Milani, R
Guida, C
Volponi, S
机构：
[1] Univ Milan, INFM, Dipartimento Fis, I-20133 Milan, Italy
[2] ABB Serv Srl, Div Res, I-20099 Milan, Italy
来源：
THIN SOLID FILMS | 2002年 / 419卷 / 1-2期
关键词：
atomic force microscopy; tribology; nanostructures; polymers;
D O I：
10.1016/S0040-6090(02)00778-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We present the result of a systematic study of the tribological properties of industrial polytetrafluorethylene (PTFE)-based coatings carried out with an atomic force microscope. A new characterization protocol allowed the reliable and quantitative assessment of the friction coefficient and adhesion forces at the sub-micrometer scale even for highly corrugated industrial samples. We have studied and compared PTFE coatings charged with different additives in dry and humid environment. The influence of additives and humidity on the friction coefficient and on adhesion forces has been investigated using standard silicon nitride tips as sliders in the low-load regime. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：154 / 159
页数：6
相关论文
共 50 条
[31]   Atomic Force Microscopy for Protein Detection and Their Physicochemical Characterization [J].
Pleshakova, Tatyana O. ;
Bukharina, Natalia S. ;
Archakov, Alexander I. ;
Ivanov, Yuri D. .
INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES, 2018, 19 (04)
[32]   Characterization of Amyloid Fibril Networks by Atomic Force Microscopy [J].
Charnley, Mirren ;
Gilbert, Jay ;
Jones, Owen G. ;
Reynolds, Nicholas P. .
BIO-PROTOCOL, 2018, 8 (04)
[33]   Characterization of quantum structures by atomic-force microscopy [J].
Wullner, D ;
Schlachetzki, A ;
Bonsch, P ;
Wehmann, HH ;
Schrimpf, T ;
Lacmann, R ;
Kipp, S .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1998, 51 (1-3) :178-187
[34]   Characterization of polyamide thin films by atomic force microscopy [J].
McIntee, Olivia M. ;
Sreedhar, Nurshaun ;
Welch, Brian C. ;
Bright, Victor M. ;
Roy, Abhishek ;
Paul, Mou ;
Greenberg, Alan R. .
POLYMER, 2024, 308
[35]   Characterization of asymmetric polysulfone membranes by atomic force microscopy [J].
Nazzarro, MS ;
Ramirez-Pastor, AJ ;
Riccardo, JL ;
Ochoa, NA ;
Marchese, J .
REVISTA MEXICANA DE FISICA, 1998, 44 :58-61
[36]   Analysis of nanocrystalline coatings of tin oxides on glass by atomic force microscopy [J].
Baranauskas, V ;
Santos, TEA ;
Schreiner, MA ;
Zhao, JG ;
Mammana, AP ;
Mammana, CIZ .
SENSORS AND ACTUATORS B-CHEMICAL, 2002, 85 (1-2) :90-94
[37]   Nanoindentation and atomic force microscopy measurements on reactively sputtered TiN coatings [J].
Barshilia, HC ;
Rajam, KS .
BULLETIN OF MATERIALS SCIENCE, 2004, 27 (01) :35-41
[38]   The Study of Nanostructured Interfacial Coatings on SiC Fibers by Atomic Force Microscopy [J].
Baklanova, N. I. ;
Zaitsev, B. N. .
HIGH-PERFORMANCE CERAMICS VI, 2010, 434-435 :542-545
[39]   Nanoindentation and atomic force microscopy measurements on reactively sputtered TiN coatings [J].
Harish C. Barshilia ;
K. S. Rajam .
Bulletin of Materials Science, 2004, 27 :35-41
[40]   TRIBOLOGICAL IMPROVEMENT AND CHARACTERIZATION OF HIP PROSTHESES WITH NANOSTRUCTURED SURFACES USING ADVANCED MICROTECHNOLOGIES AND ATOMIC FORCE MICROSCOPY [J].
Gheorghe, Gheorghe Ion ;
Badita, Liliana-Laura .
DIGEST JOURNAL OF NANOMATERIALS AND BIOSTRUCTURES, 2012, 7 (02) :529-535
12345