Density profile unfolding from Compton scattering measurements in reflection geometry

In this article, we report a mathematical procedure that allows the unfolding of the density profile from the measurement of an integrated scattering signal containing predominantly the Compton component. An experimental device (patent claimed) has been used for the measurements. It uses a radiation source with white x-ray spectrum (unpolarized) and the reflection geometry to maximize the Compton signal. The algorithm has been tested on light-element, inhomogeneous samples of uniform and non-uniform densities. Incomplete primary volume and multiple scattering corrections are also discussed. The resulting density profiles are in good agreement with direct measurements of profiles performed with other means. Copyright (c) 2006 John Wiley & Sons, Ltd.