Fabrication of probe-typed carbon nanotube point emitters

被引：37
作者：
Jung, Seung Il
Choi, Jai Seong
Shim, Hyung Cheoul
Kim, Soohyun
Jo, Sung Ho
Lee, Cheol Jin [1 ]
机构：
[1] Korea Univ, Sch Elect Engn, Seoul 136713, South Korea
[2] Hanyang Univ, Dept Nanotechnol, Seoul 133791, South Korea
[3] Korea Adv Inst Sci & Technol, Dept Mech Engn, Taejon 305701, South Korea
来源：
APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 23期
关键词：
ELECTRON FIELD-EMISSION; TIP; ENHANCEMENT;
D O I：
10.1063/1.2402222
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Probe-typed carbon nanotube (CNT) point emitter was fabricated by attaching single-walled CNT (SWCNT) and double-walled CNT (DWCNT) bundles onto the atomic force microscope tip using dielectrophoresis method. The field emission current from SWCNT point emitter was 4.9 mu A at 750 V, which is corresponding to the emission current density of at least 1.2x10(3) A/cm(2). The Fowler-Nordheim plots for the SWCNT and DWCNT point emitters revealed that the SWCNT bundle consists of more individual SWCNTs than DWCNT bundle and, as a result, the field emission performance of the SWCNT point emitter is better than the DWCNT point emitter. It is suggested that the probe-typed CNT point emitters can be used for microwave amplifiers and high-resolution electron-beam instruments. (c) 2006 American Institute of Physics.
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页数：3
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