TEM and X-ray diffraction investigation of the structural characteristics of the microporous oxide film formed on polycrystalline Ti

被引：9
|
作者：
de Mussy, JPG
Langelaan, G
Decerf, J
Delplancke, JL
机构：
[1] Free Univ Brussels, Dept Mat Sci & Electrochem, B-1050 Brussels, Belgium
[2] Katholieke Univ Leuven, Dept Met & Mat Engn, B-3001 Heverlee, Belgium
来源：
SCRIPTA MATERIALIA | 2003年 / 48卷 / 01期
关键词：
TEM; X-ray diffraction; titanium; TiO2; texture;
D O I：
10.1016/S1359-6462(02)00323-8
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The microporous TiO2 layer in the vicinity of the Ti-TiO2 interface is formed by a great amount of tiny crystallites. Bigger anatase and rutile crystals stand in the outer region of the oxide. The orientation of a proportion of the TiO2 crystals is influenced by the underlying textured Ti substrate. (C) 2003 Published by Elsevier Science Ltd. on behalf of Acta Materialia Inc.
引用
收藏
页码：23 / 29
页数：7
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