Bandgap engineering of MoS2/MX2 (MX2 = WS2, MoSe2 and WSe2) heterobilayers subjected to biaxial strain and normal compressive strain

被引:43
作者
Su, Xiangying [1 ]
Ju, Weiwei [1 ]
Zhang, Ruizhi [2 ]
Guo, Chongfeng [2 ]
Zheng, Jiming [2 ]
Yong, Yongliang [1 ]
Li, Xiaohong [1 ]
机构
[1] Henan Univ Sci & Technol, Sch Phys & Engn, 263 Kaiyuan Rd, Luoyang 471023, Peoples R China
[2] NW Univ Xian, Nat Key Lab Photoelect Technol & Funct Mat Cultur, Natl Photoelect Technol & Funct Mat & Applicat Sc, Inst Photon & Photon Technol,Dept Phys, Xian 710069, Peoples R China
基金
中国国家自然科学基金;
关键词
TRANSITION-METAL DICHALCOGENIDES; TOTAL-ENERGY CALCULATIONS; ELECTRONIC-PROPERTIES; HETEROSTRUCTURES; EXFOLIATION; GRAPHENE; GROWTH; GAP; SE;
D O I
10.1039/c5ra27871f
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Using first-principles calculations, we studied the electronic properties of quasi-2D MoS2/MX2 (MX2 = WS2, MoSe2 and WSe2) heterobilayers, focusing on engineering the band gap via application of in-plane biaxial strain and out-of-plane normal compressive strain (NCS). All heterobilayers show semiconducting characteristics with an indirect band gap except for the MoS2/WSe2 system which exhibits direct band gap character. The band gaps can all be widely tuned through strain and semiconductor-metal transitions can occur. In particular the direct band gap can be tuned and an appropriate compressive strain can tune the direct band gap of MoS2/WSe2 and MoS2/MoSe2, but MoS2/WS2 does not exhibit a direct band gap under any circumstances.
引用
收藏
页码:18319 / 18325
页数:7
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