Electrostatic force at mica surfaces proved by frequency-shift spectroscopy

被引：2

作者：

Naito, Y ^{[1
]}

Maeda, Y ^{[1
]}

Matsumoto, T ^{[1
]}

Kawai, T ^{[1
]}

机构：

[1] Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan

来源：

SURFACE SCIENCE | 2000年 / 459卷 / 1-2期

关键词：

adhesion; atomic force microscopy; field effect; insulating surfaces; mica; surface electronic phenomena (work function; surface potential; surface states; etc.);

D O I：

10.1016/S0039-6028(00)00410-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have investigated force interactions between a conductive silicon tip and a mica surface using frequency-shift spectroscopy with a non-contact atomic force microscope in ultrahigh vacuum conditions. The frequency shift and amplitude damping of the cantilever oscillation were analyzed using the Krylov-Bogoliubov method. The analysis identifies characteristic tip-sample interactions, i.e., van der Waals', adhesion and electrostatic forces, from the total force. Polarization of the water layer on the mica surface was found to affect the electrostatic potential between the tip and the surface. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：L446 / L450

页数：5

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