Single-stage single-switch input-current-shaping technique with reduced switching loss

被引：32

作者：

Huber, L ^{[1
]}

Jovanovic, MM ^{[1
]}

机构：

[1] Delta Prod Corp, Power Elect Lab, Res Triangle Pk, NC 27709 USA

来源：

IEEE TRANSACTIONS ON POWER ELECTRONICS | 2000年 / 15卷 / 04期

关键词：

line current; power factor correction; single-state ac-dc conversion;

D O I：

10.1109/63.849038

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, a new single-stage, single-switch input-current-shaping ((SICS)-I-4) technique which features substantially reduced turn-on switching loss of the switch in a S4ICS flyback topology is described. In the proposed technique, the turn-on switching loss due to the discharging of the output capacitance of the switch is reduced by turning on the switch when its voltage is minimum. To achieve the turn-on loss reduction for a wide range of line and load conditions, the flyback transformer is continuously operated at the boundary of the continuous conduction mode (CCM) and discontinuous conduction mode (DCM) by employing a variable-frequency control. The performance of the new S4ICS flyback technique was evaluated on a 70-W (20-V/3.5-A) experimental prototype.

引用

页码：681 / 687

页数：7

共 11 条

[1]

HUA G, 1998, Patent No. 5790389

[2]

Huber L, 1997, IEEE POWER ELECTRON, P519, DOI 10.1109/PESC.1997.616772

[3]

Huber L, 1997, APPL POWER ELECT CO, P272, DOI 10.1109/APEC.1997.581464

[4]

MADIGAN M, 1992, IEEE POWER ELECTRON, P1043, DOI 10.1109/PESC.1992.254769

[5]

Qian JR, 1997, APPL POWER ELECT CO, P281, DOI 10.1109/APEC.1997.581465

[6]

REDL R, 1995, APPL POWER ELECT CO, P454, DOI 10.1109/APEC.1995.468987

[7]

Sebastian J, 1998, APPL POWER ELECT CO, P461, DOI 10.1109/APEC.1998.647730

[8]

TERAMOTO S, 1994, Patent No. 5301095

[9]

Tsai FS, 1996, INTELEC - EIGHTEENTH INTERNATIONAL TELECOMMUNICATIONS ENERGY CONFERENCE, P120, DOI 10.1109/INTLEC.1996.572389

[10]

Watanabe H, 1995, INTELEC 95 - SEVENTEENTH INTERNATIONAL TELECOMMUNICATIONS ENERGY CONFERENCE, P783, DOI 10.1109/INTLEC.1995.499048

← 1 2 →