A scale-free goodness-of-fit statistic for the exponential distribution based on maximum correlations

被引:15
作者
Fortiana, J [1 ]
Grané, A [1 ]
机构
[1] Univ Barcelona, Dept Estadist, Barcelona 08007, Spain
关键词
goodness-of-fit; maximum correlation; L-statistics; exponentiality;
D O I
10.1016/S0378-3758(02)00272-0
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
We propose a goodness-of-fit statistic for testing exponentiality based on Hoeffding's maximum correlation. We study its small and large sample properties, we obtain its exact distribution, tables of exact and asymptotic critical values, and some power curves. We compare this statistic with the Gini statistic, the Shapiro-Wilk statistic for exponentiality and the Stephens' modification of the latter. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:85 / 97
页数:13
相关论文
共 11 条
[1]  
[Anonymous], 1986, GOODNESS OF FIT TECH
[2]   INEQUALITIES FOR XI-K(X,Y) WHEN MARGINALS ARE FIXED [J].
CAMBANIS, S ;
SIMONS, G ;
STOUT, W .
ZEITSCHRIFT FUR WAHRSCHEINLICHKEITSTHEORIE UND VERWANDTE GEBIETE, 1976, 36 (04) :285-294
[3]  
CHOULAKIAN V, 1997, GOODNESS OF FIT TEST
[4]  
CUADRAS CM, 1993, MULTIVARIATE ANAL FU, V2, P47
[5]  
DAVID HA, 1981, ORDER STAT
[6]  
Dwass M., 1961, TRABAJOS ESTADISTICA, V12, P11
[7]  
FORTIANA J, 1999, LOCATION SCALE FREE
[8]  
GAIL MH, 1978, J ROY STAT SOC B MET, V40, P350
[10]   ANALYSIS OF VARIANCE TEST FOR EXPONENTIAL DISTRIBUTION (COMPLETE SAMPLES) [J].
SHAPIRO, SS ;
WILK, MB .
TECHNOMETRICS, 1972, 14 (02) :355-&